With each single X-ray pulse having its own characteristics, understanding the individual property of each X-ray free-electron laser (XFEL) pulse is essential for its applications in probing and manipulating specimens as well as in diagnosing the lasing performance. Intensive research using XFEL rad...
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 27(2020), Pt 1 vom: 01. Jan., Seite 17-24
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| 1. Verfasser: |
Lee, Heemin
(VerfasserIn) |
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| Weitere Verfasser: |
Shin, Jaeyong,
Cho, Do Hyung,
Jung, Chulho,
Sung, Daeho,
Ahn, Kangwoo,
Nam, Daewoong,
Kim, Sangsoo,
Kim, Kyung Sook,
Park, Sang Yeon,
Fan, Jiadong,
Jiang, Huaidong,
Kang, Hyun Chol,
Tono, Kensuke,
Yabashi, Makina,
Ishikawa, Tetsuya,
Noh, Do Young,
Song, Changyong |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2020
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
X-ray free-electron lasers
beam profile
coherence
pulse energy
single-particle diffraction |
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