Recent Progress in Lithium Niobate : Optical Damage, Defect Simulation, and On-Chip Devices

© 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 32(2020), 3 vom: 06. Jan., Seite e1806452
1. Verfasser: Kong, Yongfa (VerfasserIn)
Weitere Verfasser: Bo, Fang, Wang, Weiwei, Zheng, Dahuai, Liu, Hongde, Zhang, Guoquan, Rupp, Romano, Xu, Jingjun
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2020
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Review defect simulation calculation integrated photonics lithium niobate on-chip devices optical damage resistance
LEADER 01000naa a22002652 4500
001 NLM29895432X
003 DE-627
005 20231225095304.0
007 cr uuu---uuuuu
008 231225s2020 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.201806452  |2 doi 
028 5 2 |a pubmed24n0996.xml 
035 |a (DE-627)NLM29895432X 
035 |a (NLM)31282003 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Kong, Yongfa  |e verfasserin  |4 aut 
245 1 0 |a Recent Progress in Lithium Niobate  |b Optical Damage, Defect Simulation, and On-Chip Devices 
264 1 |c 2020 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 24.01.2020 
500 |a Date Revised 30.09.2020 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. 
520 |a Lithium niobate (LN) is one of the most important synthetic crystals. In the past two decades, many breakthroughs have been made in material technology, theoretical understanding, and application of LN crystals. Recent progress in optical damage, defect simulation, and on-chip devices of LN are explored. Optical damage is one of the main obstacles for the practical usage of LN crystals. Recent results reveal that doping with ZrO2 not only leads to better optical damage resistance in the visible but also improves resistance in the ultraviolet region. It is still awkward to extract defect characteristics and their relationship with the physical properties of LN crystals directly from experimental investigations. Recent simulations provide detailed descriptions of intrinsic defect models, the site occupation of dopants and the variation of energy levels due to extrinsic defects. LN is considered to be one of the most promising platforms for integrated photonics. Benefiting from advances in smart-cut, direct wafer bonding and layer transfer techniques, great progress has been made in the past decade for LNs on insulators. Recent progress on on-chip LN micro-photonic devices and nonlinear optical effects, in particular photorefractive effects, are briefly reviewed 
650 4 |a Journal Article 
650 4 |a Review 
650 4 |a defect simulation calculation 
650 4 |a integrated photonics 
650 4 |a lithium niobate 
650 4 |a on-chip devices 
650 4 |a optical damage resistance 
700 1 |a Bo, Fang  |e verfasserin  |4 aut 
700 1 |a Wang, Weiwei  |e verfasserin  |4 aut 
700 1 |a Zheng, Dahuai  |e verfasserin  |4 aut 
700 1 |a Liu, Hongde  |e verfasserin  |4 aut 
700 1 |a Zhang, Guoquan  |e verfasserin  |4 aut 
700 1 |a Rupp, Romano  |e verfasserin  |4 aut 
700 1 |a Xu, Jingjun  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 32(2020), 3 vom: 06. Jan., Seite e1806452  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g volume:32  |g year:2020  |g number:3  |g day:06  |g month:01  |g pages:e1806452 
856 4 0 |u http://dx.doi.org/10.1002/adma.201806452  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 32  |j 2020  |e 3  |b 06  |c 01  |h e1806452