Material Classification from Time-of-Flight Distortions
This paper presents a material classification method using an off-the-shelf Time-of-Flight (ToF) camera. The proposed method is built upon a key observation that the depth measurement by a ToF camera is distorted for objects with certain materials, especially with translucent materials. We show that...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | IEEE transactions on pattern analysis and machine intelligence. - 1979. - 41(2019), 12 vom: 15. Dez., Seite 2906-2918
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| 1. Verfasser: |
Tanaka, Kenichiro
(VerfasserIn) |
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| Weitere Verfasser: |
Mukaigawa, Yasuhiro,
Funatomi, Takuya,
Kubo, Hiroyuki,
Matsushita, Yasuyuki,
Yagi, Yasushi |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2019
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on pattern analysis and machine intelligence
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| Schlagworte: | Journal Article |
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