Material Classification from Time-of-Flight Distortions

This paper presents a material classification method using an off-the-shelf Time-of-Flight (ToF) camera. The proposed method is built upon a key observation that the depth measurement by a ToF camera is distorted for objects with certain materials, especially with translucent materials. We show that...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on pattern analysis and machine intelligence. - 1979. - 41(2019), 12 vom: 15. Dez., Seite 2906-2918
1. Verfasser: Tanaka, Kenichiro (VerfasserIn)
Weitere Verfasser: Mukaigawa, Yasuhiro, Funatomi, Takuya, Kubo, Hiroyuki, Matsushita, Yasuyuki, Yagi, Yasushi
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2019
Zugriff auf das übergeordnete Werk:IEEE transactions on pattern analysis and machine intelligence
Schlagworte:Journal Article
Beschreibung
Zusammenfassung:This paper presents a material classification method using an off-the-shelf Time-of-Flight (ToF) camera. The proposed method is built upon a key observation that the depth measurement by a ToF camera is distorted for objects with certain materials, especially with translucent materials. We show that this distortion is due to the variation of time domain impulse responses across materials and also due to the measurement mechanism of the ToF cameras. Specifically, we reveal that the amount of distortion varies according to the modulation frequency of the ToF camera, the object material, and the distance between the camera and object. Our method uses the depth distortion of ToF measurements as a feature for classification and achieves material classification of a scene. Effectiveness of the proposed method is demonstrated by numerical evaluations and real-world experiments, showing its capability of material classification, even for visually indistinguishable objects
Beschreibung:Date Revised 04.03.2020
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1939-3539
DOI:10.1109/TPAMI.2018.2869885