Performance of quartz- and sapphire-based double-crystal high-resolution (∼10 meV) RIXS monochromators under varying power loads
In the context of a novel, high-resolution resonant inelastic X-ray scattering spectrometer, a flat-crystal-based quartz analyzer system has recently been demonstrated to provide an unprecedented intrinsic-energy resolution of 3.9 meV at the Ir L3 absorption edge (11.215 keV) [Kim et al. (2018) Sci....
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 4 vom: 01. Juli, Seite 1030-1035
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| 1. Verfasser: |
Gog, Thomas
(VerfasserIn) |
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| Weitere Verfasser: |
Casa, Diego M,
Knopp, Jonathan,
Kim, Jungho,
Upton, Mary H,
Krakora, Richard,
Jaski, Alan,
Said, Ayman,
Yavaş, Hasan,
Gretarsson, Hlynur,
Huang, Xian Rong |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2018
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
RIXS
X-ray optics
high-resolution monochromators
non-traditional crystal materials
resonant inelastic X-ray scattering |
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