Atomic Force Microscopy Force Mapping Analysis of an Adsorbed Surfactant above and below the Critical Micelle Concentration
Force curves collected using an atomic force microscope (AFM) in the presence of adsorbed surfactants are often used to draw conclusions about adsorbed film packing, rigidity, and thickness. However, some noteworthy features of such force curve characteristics have yet to be thoroughly investigated...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 34(2018), 25 vom: 26. Juni, Seite 7223-7239
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| 1. Verfasser: |
Hamon, J J
(VerfasserIn) |
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| Weitere Verfasser: |
Tabor, Rico F,
Striolo, Alberto,
Grady, Brian P |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2018
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
Research Support, U.S. Gov't, Non-P.H.S. |
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