The microwave dielectric properties of (Ba0.1Pb0.9)(Zr0.52Ti0.48)O3 (BPZT) and ZnO thin films with thicknesses below were investigated. No significant dielectric relaxation was observed for both BPZT and ZnO up to 30 GHz. The intrinsic dielectric constant of BPZT was as high as 980 at 30 GHz. The ab...
Bibliographische Detailangaben
| Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 65(2018), 5 vom: 07. Mai, Seite 881-888
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| 1. Verfasser: |
Tierno, Davide
(VerfasserIn) |
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| Weitere Verfasser: |
Dekkers, Matthijn,
Wittendorp, Paul,
Sun, Xiao,
Bayer, Samuel C,
King, Seth T,
Van Elshocht, Sven,
Heyns, Marc,
Radu, Iuliana P,
Adelmann, Christoph |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2018
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't |
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