Pulse-resolved intensity measurements at a hard X-ray FEL using semi-transparent diamond detectors
Solid-state ionization chambers are presented based on thin diamond crystals that allow pulse-resolved intensity measurements at a hard X-ray free-electron laser (FEL), up to the 4.5 MHz repetition rate that will become available at the European XFEL. Due to the small X-ray absorption of diamond the...
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Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 25(2018), Pt 1 vom: 01. Jan., Seite 177-188
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| 1. Verfasser: |
Roth, Thomas
(VerfasserIn) |
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| Weitere Verfasser: |
Freund, Wolfgang,
Boesenberg, Ulrike,
Carini, Gabriella,
Song, Sanghoon,
Lefeuvre, Gwenaëlle,
Goikhman, Alexander,
Fischer, Martin,
Schreck, Matthias,
Grünert, Jan,
Madsen, Anders |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2018
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
X-ray intensity measurement
XFEL
diamond detector |
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