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231225s2018 xx |||||o 00| ||eng c |
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|a 10.1002/adma.201703675
|2 doi
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|a pubmed24n0926.xml
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|a (DE-627)NLM278013163
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|a (NLM)29134691
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|a DE-627
|b ger
|c DE-627
|e rakwb
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| 041 |
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|a eng
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| 100 |
1 |
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|a Kwon, Owoong
|e verfasserin
|4 aut
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| 245 |
1 |
0 |
|a Direct Probing of Polarization Charge at Nanoscale Level
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1 |
|c 2018
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| 336 |
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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| 338 |
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|a ƒa Online-Ressource
|b cr
|2 rdacarrier
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| 500 |
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|a Date Completed 01.08.2018
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|a Date Revised 30.09.2020
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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|a Ferroelectric materials possess spontaneous polarization that can be used for multiple applications. Owing to a long-term development of reducing the sizes of devices, the preparation of ferroelectric materials and devices is entering the nanometer-scale regime. Accordingly, to evaluate the ferroelectricity, there is a need to investigate the polarization charge at the nanoscale. Nonetheless, it is generally accepted that the detection of polarization charges using a conventional conductive atomic force microscopy (CAFM) without a top electrode is not feasible because the nanometer-scale radius of an atomic force microscopy (AFM) tip yields a very low signal-to-noise ratio. However, the detection is unrelated to the radius of an AFM tip and, in fact, a matter of the switched area. In this work, the direct probing of the polarization charge at the nanoscale is demonstrated using the positive-up-negative-down method based on the conventional CAFM approach without additional corrections or circuits to reduce the parasitic capacitance. The polarization charge densities of 73.7 and 119.0 µC cm-2 are successfully probed in ferroelectric nanocapacitors and thin films, respectively. The obtained results show the feasibility of the evaluation of polarization charge at the nanoscale and provide a new guideline for evaluating the ferroelectricity at the nanoscale
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4 |
|a Journal Article
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4 |
|a conductive atomic force microscopy
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4 |
|a nanoscale
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4 |
|a piezoresponse force microscopy
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4 |
|a polarization charge
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4 |
|a positive-up-negative-down
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| 700 |
1 |
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|a Seol, Daehee
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Lee, Dongkyu
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Han, Hee
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Lindfors-Vrejoiu, Ionela
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Lee, Woo
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Jesse, Stephen
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Lee, Ho Nyung
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Kalinin, Sergei V
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Alexe, Marin
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Kim, Yunseok
|e verfasserin
|4 aut
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| 773 |
0 |
8 |
|i Enthalten in
|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 30(2018), 1 vom: 15. Jan.
|w (DE-627)NLM098206397
|x 1521-4095
|7 nnns
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| 773 |
1 |
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|g volume:30
|g year:2018
|g number:1
|g day:15
|g month:01
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| 856 |
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|u http://dx.doi.org/10.1002/adma.201703675
|3 Volltext
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|a GBV_USEFLAG_A
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|a SYSFLAG_A
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|a GBV_NLM
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|a GBV_ILN_350
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|a AR
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|d 30
|j 2018
|e 1
|b 15
|c 01
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