Solution Combustion Synthesis : Low-Temperature Processing for p-Type Cu:NiO Thin Films for Transparent Electronics
© 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Publié dans: | Advanced materials (Deerfield Beach, Fla.). - 1998. - 29(2017), 34 vom: 10. Sept. |
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Auteur principal: | |
Autres auteurs: | , , , , , , |
Format: | Article en ligne |
Langue: | English |
Publié: |
2017
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Accès à la collection: | Advanced materials (Deerfield Beach, Fla.) |
Sujets: | Journal Article low-temperature processing low-voltage operation p-type oxide semiconductor solution combustion synthesis thin-film transistor |
Résumé: | © 2017 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Low-temperature solution processing opens a new window for the fabrication of oxide semiconductors due to its simple, low cost, and large-area uniformity. Herein, by using solution combustion synthesis (SCS), p-type Cu-doped NiO (Cu:NiO) thin films are fabricated at a temperature lower than 150 °C. The light doping of Cu substitutes the Ni site and disperses the valence band of the NiO matrix, leading to an enhanced p-type conductivity. Their integration into thin-film transistors (TFTs) demonstrates typical p-type semiconducting behavior. The optimized Cu5% NiO TFT exhibits outstanding electrical performance with a hole mobility of 1.5 cm2 V-1 s-1 , a large on/off current ratio of ≈104 , and clear switching characteristics under dynamic measurements. The employment of a high-k ZrO2 gate dielectric enables a low operating voltage (≤2 V) of the TFTs, which is critical for portable and battery-driven devices. The construction of a light-emitting-diode driving circuit demonstrates the high current control capability of the resultant TFTs. The achievement of the low-temperature-processed Cu:NiO thin films via SCS not only provides a feasible approach for low-cost flexible p-type oxide electronics but also represents a significant step toward the development of complementary metal-oxide semiconductor circuits |
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Description: | Date Completed 18.07.2018 Date Revised 01.10.2020 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
ISSN: | 1521-4095 |
DOI: | 10.1002/adma.201701599 |