Accuracy of stress measurement by Laue microdiffraction (Laue-DIC method) : the influence of image noise, calibration errors and spot number

Laue microdiffraction, available at several synchrotron radiation facilities, is well suited for measuring the intragranular stress field in deformed materials thanks to the achievable submicrometer beam size. The traditional method for extracting elastic strain (and hence stress) and lattice orient...

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Veröffentlicht in:	Journal of synchrotron radiation. - 1994. - 24(2017), Pt 4 vom: 01. Juli, Seite 802-817
1. Verfasser:	Zhang, F G (VerfasserIn)
Weitere Verfasser:	Bornert, M, Petit, J, Castelnau, O
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2017
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article Laue microdiffraction digital image correlation image noise stress analysis