Interface-sensitive imaging by an image reconstruction aided X-ray reflectivity technique

Recently, the authors have succeeded in realizing X-ray reflectivity imaging of heterogeneous ultrathin films at specific wavevector transfers by applying a wide parallel beam and an area detector. By combining in-plane angle and grazing-incidence angle scans, it is possible to reconstruct a series...

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Veröffentlicht in:Journal of applied crystallography. - 1998. - 50(2017), Pt 3 vom: 01. Juni, Seite 712-721
1. Verfasser: Jiang, Jinxing (VerfasserIn)
Weitere Verfasser: Hirano, Keiichi, Sakurai, Kenji
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:Journal of applied crystallography
Schlagworte:Journal Article X-ray reflectivity image reconstruction micro-imaging surfaces and interfaces visualization
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700 1 |a Sakurai, Kenji  |e verfasserin  |4 aut 
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