Interface-sensitive imaging by an image reconstruction aided X-ray reflectivity technique
Recently, the authors have succeeded in realizing X-ray reflectivity imaging of heterogeneous ultrathin films at specific wavevector transfers by applying a wide parallel beam and an area detector. By combining in-plane angle and grazing-incidence angle scans, it is possible to reconstruct a series...
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 50(2017), Pt 3 vom: 01. Juni, Seite 712-721 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Journal Article X-ray reflectivity image reconstruction micro-imaging surfaces and interfaces visualization |
| Online verfügbar |
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