Introduction to the special issue on high-resolution X-ray diffraction and imaging
The latest virtual special issue of Journal of Applied Crystallography features some highlights of the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016), held in Brno, Czech Republic, in September 2016
| Veröffentlicht in: | Journal of applied crystallography. - 1998. - 50(2017), Pt 3 vom: 01. Juni, Seite 671-672 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Journal of applied crystallography |
| Schlagworte: | Editorial editorial high-resolution X-ray diffraction imaging |
| Zusammenfassung: | The latest virtual special issue of Journal of Applied Crystallography features some highlights of the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016), held in Brno, Czech Republic, in September 2016 |
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| Beschreibung: | Date Revised 30.09.2020 published: Electronic-eCollection Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |
| DOI: | 10.1107/S1600576717007257 |