Introduction to the special issue on high-resolution X-ray diffraction and imaging
The latest virtual special issue of Journal of Applied Crystallography features some highlights of the 13th Biennial Conference on High-Resolution X-ray Diffraction and Imaging (XTOP 2016), held in Brno, Czech Republic, in September 2016
| Publié dans: | Journal of applied crystallography. - 1998. - 50(2017), Pt 3 vom: 01. Juni, Seite 671-672 |
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| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2017
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| Accès à la collection: | Journal of applied crystallography |
| Sujets: | Editorial editorial high-resolution X-ray diffraction imaging |
| Accès en ligne |
Volltext |