Robust Nanoparticles Detection From Noisy Background by Fusing Complementary Image Information
This paper studies the problem of detecting the presence of nanoparticles in noisy transmission electron microscopic (TEM) images and then fitting each nanoparticle with an elliptic shape model. In order to achieve robustness while handling low contrast and high noise in the TEM images, we propose a...
| Publié dans: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - 25(2016), 12 vom: 15. Dez., Seite 5713-5726 |
|---|---|
| Auteur principal: | |
| Autres auteurs: | , , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2016
|
| Accès à la collection: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society |
| Sujets: | Journal Article |
| Accès en ligne |
Volltext |