Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis

Coherent X-ray beam metrology using 2D high-resolution Fresnel-diffraction analysis

Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi-parametric metrology from as low as a single shot is desirable. Here a two-dime...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 24(2017), Pt 1 vom: 01. Jan., Seite 196-204
1. Verfasser: Ruiz-Lopez, M (VerfasserIn)
Weitere Verfasser: Faenov, A, Pikuz, T, Ozaki, N, Mitrofanov, A, Albertazzi, B, Hartley, N, Matsuoka, T, Ochante, Y, Tange, Y, Yabuuchi, T, Habara, T, Tanaka, K A, Inubushi, Y, Yabashi, M, Nishikino, M, Kawachi, T, Pikuz, S, Ishikawa, T, Kodama, R, Bleiner, D
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Fresnel diffraction LiF SACLA X-ray X-ray imaging detector beam metrology color centers fourth-generation source
Beschreibung
Zusammenfassung:Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi-parametric metrology from as low as a single shot is desirable. Here a two-dimensional (2D) procedure based on high-resolution Fresnel diffraction analysis is discussed and applied, which allowed an efficient and detailed beamline characterization at the SACLA XFEL. So far, the potential of Fresnel diffraction for beamline metrology has not been fully exploited because its high-frequency fringes could be only partly resolved with ordinary pixel-limited detectors. Using the high-spatial-frequency imaging capability of an irradiated LiF crystal, 2D information of the coherence degree, beam divergence and beam quality factor M2 were retrieved from simple diffraction patterns. The developed beam metrology was validated with a laboratory reference laser, and then successfully applied at a beamline facility, in agreement with the source specifications
Beschreibung:Date Completed 11.07.2017
Date Revised 13.07.2017
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577516016568