Direct metrology of coherent short-wavelength beamlines is important for obtaining operational beam characteristics at the experimental site. However, since beam-time limitation imposes fast metrology procedures, a multi-parametric metrology from as low as a single shot is desirable. Here a two-dime...
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 24(2017), Pt 1 vom: 01. Jan., Seite 196-204
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| 1. Verfasser: |
Ruiz-Lopez, M
(VerfasserIn) |
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| Weitere Verfasser: |
Faenov, A,
Pikuz, T,
Ozaki, N,
Mitrofanov, A,
Albertazzi, B,
Hartley, N,
Matsuoka, T,
Ochante, Y,
Tange, Y,
Yabuuchi, T,
Habara, T,
Tanaka, K A,
Inubushi, Y,
Yabashi, M,
Nishikino, M,
Kawachi, T,
Pikuz, S,
Ishikawa, T,
Kodama, R,
Bleiner, D |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2017
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
Fresnel diffraction
LiF
SACLA
X-ray
X-ray imaging detector
beam metrology
color centers
fourth-generation source |
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