Scanning Probe Nanopatterning and Layer-by-Layer Thinning of Black Phosphorus

Scanning Probe Nanopatterning and Layer-by-Layer Thinning of Black Phosphorus

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 29(2017), 1 vom: 21. Jan.
1. Verfasser: Liu, Xiaolong (VerfasserIn)
Weitere Verfasser: Chen, Kan-Sheng, Wells, Spencer A, Balla, Itamar, Zhu, Jian, Wood, Joshua D, Hersam, Mark C
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article 2D conductive atomic force microscopy nanolithography phosphorene phosphorus oxide transistors
LEADER 01000caa a22002652 4500
001 NLM265925843
003 DE-627
005 20250220204240.0
007 cr uuu---uuuuu
008 231224s2017 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.201604121  |2 doi 
028 5 2 |a pubmed25n0886.xml 
035 |a (DE-627)NLM265925843 
035 |a (NLM)27813243 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Liu, Xiaolong  |e verfasserin  |4 aut 
245 1 0 |a Scanning Probe Nanopatterning and Layer-by-Layer Thinning of Black Phosphorus 
264 1 |c 2017 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 18.07.2018 
500 |a Date Revised 01.10.2020 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. 
520 |a Nanopatterning and layer-by-layer thinning of black phosphorus is demonstrated with conductive atomic-force-microscope anodic oxidation. The liquid-phase patterning byproduct is readily removed by water rinsing. An alternating-current bias enables direct nanopatterning and thinning on insulating substrates such as SiO2 /Si. Field-effect transistors with patterned channels show significant improvements in current modulation by up to a factor of 50 
650 4 |a Journal Article 
650 4 |a 2D 
650 4 |a conductive atomic force microscopy 
650 4 |a nanolithography 
650 4 |a phosphorene 
650 4 |a phosphorus oxide 
650 4 |a transistors 
700 1 |a Chen, Kan-Sheng  |e verfasserin  |4 aut 
700 1 |a Wells, Spencer A  |e verfasserin  |4 aut 
700 1 |a Balla, Itamar  |e verfasserin  |4 aut 
700 1 |a Zhu, Jian  |e verfasserin  |4 aut 
700 1 |a Wood, Joshua D  |e verfasserin  |4 aut 
700 1 |a Hersam, Mark C  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 29(2017), 1 vom: 21. Jan.  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g volume:29  |g year:2017  |g number:1  |g day:21  |g month:01 
856 4 0 |u http://dx.doi.org/10.1002/adma.201604121  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 29  |j 2017  |e 1  |b 21  |c 01