Scanning Probe Nanopatterning and Layer-by-Layer Thinning of Black Phosphorus

Scanning Probe Nanopatterning and Layer-by-Layer Thinning of Black Phosphorus

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 29(2017), 1 vom: 21. Jan.
1. Verfasser: Liu, Xiaolong (VerfasserIn)
Weitere Verfasser: Chen, Kan-Sheng, Wells, Spencer A, Balla, Itamar, Zhu, Jian, Wood, Joshua D, Hersam, Mark C
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2017
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article 2D conductive atomic force microscopy nanolithography phosphorene phosphorus oxide transistors
Beschreibung
Zusammenfassung:© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Nanopatterning and layer-by-layer thinning of black phosphorus is demonstrated with conductive atomic-force-microscope anodic oxidation. The liquid-phase patterning byproduct is readily removed by water rinsing. An alternating-current bias enables direct nanopatterning and thinning on insulating substrates such as SiO2 /Si. Field-effect transistors with patterned channels show significant improvements in current modulation by up to a factor of 50
Beschreibung:Date Completed 18.07.2018
Date Revised 01.10.2020
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201604121