Fabrication and testing of a newly designed slit system for depth-resolved X-ray diffraction measurements
A new system of slits called `spiderweb slits' have been developed for depth-resolved powder or polycrystalline X-ray diffraction measurements. The slits act on diffracted X-rays to select a particular gauge volume of sample, while absorbing diffracted X-rays from outside of this volume. Althou...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 23(2016), Pt 6 vom: 01. Nov., Seite 1296-1304 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2016
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article Research Support, U.S. Gov't, Non-P.H.S. Research Support, Non-U.S. Gov't depth-resolved ray-tracing slits synchrotron X-ray powder diffraction |