IOTA : integration optimization, triage and analysis tool for the processing of XFEL diffraction images

Serial femtosecond crystallography (SFX) uses an X-ray free-electron laser to extract diffraction data from crystals not amenable to conventional X-ray light sources owing to their small size or radiation sensitivity. However, a limitation of SFX is the high variability of the diffraction images tha...

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Bibliographische Detailangaben

Veröffentlicht in:	Journal of applied crystallography. - 1998. - 49(2016), Pt 3 vom: 01. Juni, Seite 1057-1064
1. Verfasser:	Lyubimov, Artem Y (VerfasserIn)
Weitere Verfasser:	Uervirojnangkoorn, Monarin, Zeldin, Oliver B, Brewster, Aaron S, Murray, Thomas D, Sauter, Nicholas K, Berger, James M, Weis, William I, Brunger, Axel T
Format:	Aufsatz
Sprache:	English
Veröffentlicht:	2016
Zugriff auf das übergeordnete Werk:	Journal of applied crystallography
Schlagworte:	Journal Article X-ray free-electron lasers XFELs computer programs diffraction data processing indexing and integration serial femtosecond crystallography