Giant Resistive Switching via Control of Ferroelectric Charged Domain Walls

© 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 28(2016), 31 vom: 01. Aug., Seite 6574-80
1. Verfasser: Li, Linze (VerfasserIn)
Weitere Verfasser: Britson, Jason, Jokisaari, Jacob R, Zhang, Yi, Adamo, Carolina, Melville, Alexander, Schlom, Darrell G, Chen, Long-Qing, Pan, Xiaoqing
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2016
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article charged domain walls ferroelectrics in situ transmission electron microscopy resistive switching
LEADER 01000naa a22002652 4500
001 NLM260641685
003 DE-627
005 20231224193833.0
007 cr uuu---uuuuu
008 231224s2016 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.201600160  |2 doi 
028 5 2 |a pubmed24n0868.xml 
035 |a (DE-627)NLM260641685 
035 |a (NLM)27213756 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Li, Linze  |e verfasserin  |4 aut 
245 1 0 |a Giant Resistive Switching via Control of Ferroelectric Charged Domain Walls 
264 1 |c 2016 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 17.07.2018 
500 |a Date Revised 30.09.2020 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © 2016 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. 
520 |a Controlled switching of resistivity in ferroelectric thin films is demonstrated by writing and erasing stable, nanoscale, strongly charged domain walls using an in situ transmission electron microscopy technique. The resistance can be read nondestructively and presents the largest off/on ratio (≈10(5) ) ever reported in room-temperature ferroelectric devices, opening new avenues for engineering ferroelectric thin-film devices 
650 4 |a Journal Article 
650 4 |a charged domain walls 
650 4 |a ferroelectrics 
650 4 |a in situ transmission electron microscopy 
650 4 |a resistive switching 
700 1 |a Britson, Jason  |e verfasserin  |4 aut 
700 1 |a Jokisaari, Jacob R  |e verfasserin  |4 aut 
700 1 |a Zhang, Yi  |e verfasserin  |4 aut 
700 1 |a Adamo, Carolina  |e verfasserin  |4 aut 
700 1 |a Melville, Alexander  |e verfasserin  |4 aut 
700 1 |a Schlom, Darrell G  |e verfasserin  |4 aut 
700 1 |a Chen, Long-Qing  |e verfasserin  |4 aut 
700 1 |a Pan, Xiaoqing  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 28(2016), 31 vom: 01. Aug., Seite 6574-80  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g volume:28  |g year:2016  |g number:31  |g day:01  |g month:08  |g pages:6574-80 
856 4 0 |u http://dx.doi.org/10.1002/adma.201600160  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 28  |j 2016  |e 31  |b 01  |c 08  |h 6574-80