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231224s2016 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577516003969
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|a eng
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|a Buzanich, Ana Guilherme
|e verfasserin
|4 aut
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|a Time- and spatial-resolved XAFS spectroscopy in a single shot
|b new analytical possibilities for in situ material characterization
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|c 2016
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|a Date Completed 17.08.2018
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|a Date Revised 17.08.2018
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a A new concept that comprises both time- and lateral-resolved X-ray absorption fine-structure information simultaneously in a single shot is presented. This uncomplicated set-up was tested at the BAMline at BESSY-II (Berlin, Germany). The primary broadband beam was generated by a double multilayer monochromator. The transmitted beam through the sample is diffracted by a convexly bent Si (111) crystal, producing a divergent beam. This, in turn, is collected by either an energy-sensitive area detector, the so-called color X-ray camera, or by an area-sensitive detector based on a CCD camera, in θ-2θ geometry. The first tests were performed with thin metal foils and some iron oxide mixtures. A time resolution of lower than 1 s together with a spatial resolution in one dimension of at least 50 µm is achieved
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|a Journal Article
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|a divergent XAFS
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|a single-shot XAFS
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|a spatial resolution
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|a time resolution
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|a Radtke, Martin
|e verfasserin
|4 aut
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|a Reinholz, Uwe
|e verfasserin
|4 aut
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|a Riesemeier, Heinrich
|e verfasserin
|4 aut
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|a Emmerling, Franziska
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 23(2016), Pt 3 vom: 20. Mai, Seite 769-76
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|x 1600-5775
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| 773 |
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|g volume:23
|g year:2016
|g number:Pt 3
|g day:20
|g month:05
|g pages:769-76
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|u http://dx.doi.org/10.1107/S1600577516003969
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