Characterization of the Individual Short-Term Frequency Stability of Cryogenic Sapphire Oscillators at the 10(-16) Level
We present the characterization of three cryogenic sapphire oscillators (CSOs) using the three-cornered-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyze the fractional frequency stability limitations of these state-of-the-ar...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 63(2016), 6 vom: 07. Juni, Seite 915-21
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| 1. Verfasser: |
Fluhr, Christophe
(VerfasserIn) |
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| Weitere Verfasser: |
Grop, Serge,
Dubois, Benoit,
Kersale, Yann,
Rubiola, Enrico,
Giordano, Vincent |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2016
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on ultrasonics, ferroelectrics, and frequency control
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| Schlagworte: | Journal Article |
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