Characterization of the Individual Short-Term Frequency Stability of Cryogenic Sapphire Oscillators at the 10(-16) Level

We present the characterization of three cryogenic sapphire oscillators (CSOs) using the three-cornered-hat method. Easily implemented with commercial components and instruments, this method reveals itself very useful to analyze the fractional frequency stability limitations of these state-of-the-ar...

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Publié dans:IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 63(2016), 6 vom: 07. Juni, Seite 915-21
Auteur principal: Fluhr, Christophe (Auteur)
Autres auteurs: Grop, Serge, Dubois, Benoit, Kersale, Yann, Rubiola, Enrico, Giordano, Vincent
Format: Article en ligne
Langue:English
Publié: 2016
Accès à la collection:IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Sujets:Journal Article