Estimation of errors in diffraction data measured by CCD area detectors
Current methods for diffraction-spot integration from CCD area detectors typically underestimate the errors in the measured intensities. In an attempt to understand fully and identify correctly the sources of all contributions to these errors, a simulation of a CCD-based area-detector module has bee...
| Publié dans: | Journal of applied crystallography. - 1998. - 43(2010), Pt 6 vom: 01. Dez., Seite 1356-1371 |
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| Format: | Article |
| Langue: | English |
| Publié: |
2010
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| Accès à la collection: | Journal of applied crystallography |
| Sujets: | Journal Article CCD area detectors detector simulation error estimation pixel correlation |
| Résumé: | Current methods for diffraction-spot integration from CCD area detectors typically underestimate the errors in the measured intensities. In an attempt to understand fully and identify correctly the sources of all contributions to these errors, a simulation of a CCD-based area-detector module has been produced to address the problem of correct handling of data from such detectors. Using this simulation, it has been shown how, and by how much, measurement errors are underestimated. A model of the detector statistics is presented and an adapted summation integration routine that takes this into account is shown to result in more realistic error estimates. In addition, the effect of correlations between pixels on two-dimensional profile fitting is demonstrated and the problems surrounding improvements to profile-fitting algorithms are discussed. In practice, this requires knowledge of the expected correlation between pixels in the image |
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| Description: | Date Revised 25.05.2024 published: Electronic-eCollection Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |