Estimation of errors in diffraction data measured by CCD area detectors
Current methods for diffraction-spot integration from CCD area detectors typically underestimate the errors in the measured intensities. In an attempt to understand fully and identify correctly the sources of all contributions to these errors, a simulation of a CCD-based area-detector module has bee...
| Publié dans: | Journal of applied crystallography. - 1998. - 43(2010), Pt 6 vom: 01. Dez., Seite 1356-1371 |
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| Format: | Article |
| Langue: | English |
| Publié: |
2010
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| Accès à la collection: | Journal of applied crystallography |
| Sujets: | Journal Article CCD area detectors detector simulation error estimation pixel correlation |