Soft X-ray angle-resolved photoemission with micro-positioning techniques for metallic V₂O₃

Soft X-ray angle-resolved photoemission has been performed for metallic V2O3. By combining a microfocus beam (40 µm × 65 µm) and micro-positioning techniques with a long-working-distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of s...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 22(2015), 3 vom: 30. Mai, Seite 776-80
1. Verfasser: Fujiwara, Hidenori (VerfasserIn)
Weitere Verfasser: Kiss, Takayuki, Wakabayashi, Yuki K, Nishitani, Yoshito, Mori, Takeo, Nakata, Yuki, Kitayama, Satoshi, Fukushima, Kazuaki, Ikeda, Shinji, Fuchimoto, Hiroto, Minowa, Yosuke, Mo, Sung-Kwan, Denlinger, Jonathan D, Allen, James W, Metcalf, Patricia, Imai, Masaki, Yoshimura, Kazuyoshi, Suga, Shigemasa, Muro, Takayuki, Sekiyama, Akira
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2015
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, Non-U.S. Gov't angle-resolved photoemission spectroscopy (ARPES) micro-positioning soft X-ray strongly correlated oxide
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520 |a Soft X-ray angle-resolved photoemission has been performed for metallic V2O3. By combining a microfocus beam (40 µm × 65 µm) and micro-positioning techniques with a long-working-distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of several tens of µm. The photoemission spectra show a clear position dependence, reflecting the morphology of the cleaved sample surface. By selecting high-quality flat regions on the sample surface, it has been possible to perform band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional angle-resolved photoemission spectroscopy for typical three-dimensional correlated materials where large cleavage planes are rarely obtained 
650 4 |a Journal Article 
650 4 |a Research Support, Non-U.S. Gov't 
650 4 |a angle-resolved photoemission spectroscopy (ARPES) 
650 4 |a micro-positioning 
650 4 |a soft X-ray 
650 4 |a strongly correlated oxide 
700 1 |a Kiss, Takayuki  |e verfasserin  |4 aut 
700 1 |a Wakabayashi, Yuki K  |e verfasserin  |4 aut 
700 1 |a Nishitani, Yoshito  |e verfasserin  |4 aut 
700 1 |a Mori, Takeo  |e verfasserin  |4 aut 
700 1 |a Nakata, Yuki  |e verfasserin  |4 aut 
700 1 |a Kitayama, Satoshi  |e verfasserin  |4 aut 
700 1 |a Fukushima, Kazuaki  |e verfasserin  |4 aut 
700 1 |a Ikeda, Shinji  |e verfasserin  |4 aut 
700 1 |a Fuchimoto, Hiroto  |e verfasserin  |4 aut 
700 1 |a Minowa, Yosuke  |e verfasserin  |4 aut 
700 1 |a Mo, Sung-Kwan  |e verfasserin  |4 aut 
700 1 |a Denlinger, Jonathan D  |e verfasserin  |4 aut 
700 1 |a Allen, James W  |e verfasserin  |4 aut 
700 1 |a Metcalf, Patricia  |e verfasserin  |4 aut 
700 1 |a Imai, Masaki  |e verfasserin  |4 aut 
700 1 |a Yoshimura, Kazuyoshi  |e verfasserin  |4 aut 
700 1 |a Suga, Shigemasa  |e verfasserin  |4 aut 
700 1 |a Muro, Takayuki  |e verfasserin  |4 aut 
700 1 |a Sekiyama, Akira  |e verfasserin  |4 aut 
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