Soft X-ray angle-resolved photoemission with micro-positioning techniques for metallic V₂O₃
Soft X-ray angle-resolved photoemission has been performed for metallic V2O3. By combining a microfocus beam (40 µm × 65 µm) and micro-positioning techniques with a long-working-distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of s...
Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 22(2015), 3 vom: 30. Mai, Seite 776-80 |
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Weitere Verfasser: | , , , , , , , , , , , , , , , , , , |
Format: | Online-Aufsatz |
Sprache: | English |
Veröffentlicht: |
2015
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Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
Schlagworte: | Journal Article Research Support, Non-U.S. Gov't angle-resolved photoemission spectroscopy (ARPES) micro-positioning soft X-ray strongly correlated oxide |
Zusammenfassung: | Soft X-ray angle-resolved photoemission has been performed for metallic V2O3. By combining a microfocus beam (40 µm × 65 µm) and micro-positioning techniques with a long-working-distance microscope, it has been possible to observe band dispersions from tiny cleavage surfaces with a typical size of several tens of µm. The photoemission spectra show a clear position dependence, reflecting the morphology of the cleaved sample surface. By selecting high-quality flat regions on the sample surface, it has been possible to perform band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional angle-resolved photoemission spectroscopy for typical three-dimensional correlated materials where large cleavage planes are rarely obtained |
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Beschreibung: | Date Completed 14.08.2015 Date Revised 13.11.2018 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
ISSN: | 1600-5775 |
DOI: | 10.1107/S1600577515003707 |