Crystallization dynamics and interface stability of strontium titanate thin films on silicon

Different physical vapor deposition methods have been used to fabricate strontium titanate thin films. Within the binary phase diagram of SrO and TiO2 the stoichiometry ranges from Ti rich to Sr rich, respectively. The crystallization of these amorphous SrTiO3 layers is investigated by in situ grazi...

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Publié dans:	Journal of applied crystallography. - 1998. - 48(2015), Pt 2 vom: 01. Apr., Seite 393-400
Auteur principal:	Hanzig, Florian (Auteur)
Autres auteurs:	Hanzig, Juliane, Mehner, Erik, Richter, Carsten, Veselý, Jozef, Stöcker, Hartmut, Abendroth, Barbara, Motylenko, Mykhaylo, Klemm, Volker, Novikov, Dmitri, Meyer, Dirk C
Format:	Article
Langue:	English
Publié:	2015
Accès à la collection:	Journal of applied crystallography
Sujets:	Journal Article crystallization dynamics interface stability silicon substrates strontium titanate thin films