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231224s2009 xx |||||o 00| ||eng c |
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|a 10.1002/adma.200901756
|2 doi
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|a eng
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1 |
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|a Chang, Li-Wu
|e verfasserin
|4 aut
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|a Settling the "dead layer" debate in nanoscale capacitors
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|c 2009
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|a Date Completed 08.11.2014
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|a Date Revised 30.09.2020
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a Copyright © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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|a Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO3 /Pt, but are relatively unaffected in Pt/BaTiO3 /Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers"
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|a Journal Article
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|a Alexe, Marin
|e verfasserin
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|a Scott, James F
|e verfasserin
|4 aut
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|a Gregg, J Marty
|e verfasserin
|4 aut
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|i Enthalten in
|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 21(2009), 48 vom: 28. Dez., Seite 4911-4914
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