Settling the "dead layer" debate in nanoscale capacitors
Copyright © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
| Veröffentlicht in: | Advanced materials (Deerfield Beach, Fla.). - 1998. - 21(2009), 48 vom: 28. Dez., Seite 4911-4914 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2009
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| Zugriff auf das übergeordnete Werk: | Advanced materials (Deerfield Beach, Fla.) |
| Schlagworte: | Journal Article |
| Zusammenfassung: | Copyright © 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim. Permittivity peaks in single crystal thin film capacitors are strongly suppressed compared to bulk in the case of Pt/SrTiO3 /Pt, but are relatively unaffected in Pt/BaTiO3 /Pt structures. This is consistent with the recent suggestion that subtle variations in interfacial bonding between the dielectric and electrode are critical in determining the presence or absence of inherent dielectric "dead layers" |
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| Beschreibung: | Date Completed 08.11.2014 Date Revised 30.09.2020 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1521-4095 |
| DOI: | 10.1002/adma.200901756 |