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231224s2014 xx |||||o 00| ||eng c |
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|a 10.1107/S1600577514016191
|2 doi
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|a (NLM)25343787
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|a DE-627
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|a eng
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|a Desjardins, Kewin
|e verfasserin
|4 aut
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|a Ultra-thin optical grade scCVD diamond as X-ray beam position monitor
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|c 2014
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|a Date Completed 30.03.2015
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|a Date Revised 25.10.2014
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a Results of measurements made at the SIRIUS beamline of the SOLEIL synchrotron for a new X-ray beam position monitor based on a super-thin single crystal of diamond grown by chemical vapor deposition (CVD) are presented. This detector is a quadrant electrode design processed on a 3 µm-thick membrane obtained by argon-oxygen plasma etching the central area of a CVD-grown diamond plate of 60 µm thickness. The membrane transmits more than 50% of the incident 1.3 keV energy X-ray beam. The diamond plate was of moderate purity (∼1 p.p.m. nitrogen), but the X-ray beam induced current (XBIC) measurements nevertheless showed a photo-charge collection efficiency approaching 100% for an electric field of 2 V µm(-1), corresponding to an applied bias voltage of only 6 V. XBIC mapping of the membrane showed an inhomogeneity of more than 10% across the membrane, corresponding to the measured variation in the thickness of the diamond plate before the plasma etching process. The measured XBIC signal-to-dark-current ratio of the device was greater than 10(5), and the X-ray beam position resolution of the device was better than a micrometer for a 1 kHz sampling rate
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|a Journal Article
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|a X-ray beam position monitor
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|a XBIC
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|a XBPM
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|a ultra-thin optical-grade single-crystal CVD diamond
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|a Pomorski, Michal
|e verfasserin
|4 aut
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|a Morse, John
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 21(2014), Pt 6 vom: 01. Nov., Seite 1217-23
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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|g volume:21
|g year:2014
|g number:Pt 6
|g day:01
|g month:11
|g pages:1217-23
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|u http://dx.doi.org/10.1107/S1600577514016191
|3 Volltext
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