Ultra-thin optical grade scCVD diamond as X-ray beam position monitor

Results of measurements made at the SIRIUS beamline of the SOLEIL synchrotron for a new X-ray beam position monitor based on a super-thin single crystal of diamond grown by chemical vapor deposition (CVD) are presented. This detector is a quadrant electrode design processed on a 3 µm-thick membrane...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 21(2014), Pt 6 vom: 01. Nov., Seite 1217-23
1. Verfasser: Desjardins, Kewin (VerfasserIn)
Weitere Verfasser: Pomorski, Michal, Morse, John
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2014
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray beam position monitor XBIC XBPM ultra-thin optical-grade single-crystal CVD diamond
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520 |a Results of measurements made at the SIRIUS beamline of the SOLEIL synchrotron for a new X-ray beam position monitor based on a super-thin single crystal of diamond grown by chemical vapor deposition (CVD) are presented. This detector is a quadrant electrode design processed on a 3 µm-thick membrane obtained by argon-oxygen plasma etching the central area of a CVD-grown diamond plate of 60 µm thickness. The membrane transmits more than 50% of the incident 1.3 keV energy X-ray beam. The diamond plate was of moderate purity (∼1 p.p.m. nitrogen), but the X-ray beam induced current (XBIC) measurements nevertheless showed a photo-charge collection efficiency approaching 100% for an electric field of 2 V µm(-1), corresponding to an applied bias voltage of only 6 V. XBIC mapping of the membrane showed an inhomogeneity of more than 10% across the membrane, corresponding to the measured variation in the thickness of the diamond plate before the plasma etching process. The measured XBIC signal-to-dark-current ratio of the device was greater than 10(5), and the X-ray beam position resolution of the device was better than a micrometer for a 1 kHz sampling rate 
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700 1 |a Morse, John  |e verfasserin  |4 aut 
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