dxtbx : the diffraction experiment toolbox

Data formats for recording X-ray diffraction data continue to evolve rapidly to accommodate new detector technologies developed in response to more intense light sources. Processing the data from single-crystal X-ray diffraction experiments therefore requires the ability to read, and correctly inter...

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Détails bibliographiques

Publié dans:	Journal of applied crystallography. - 1998. - 47(2014), Pt 4 vom: 01. Aug., Seite 1459-1465
Auteur principal:	Parkhurst, James M (Auteur)
Autres auteurs:	Brewster, Aaron S, Fuentes-Montero, Luis, Waterman, David G, Hattne, Johan, Ashton, Alun W, Echols, Nathaniel, Evans, Gwyndaf, Sauter, Nicholas K, Winter, Graeme
Format:	Article
Langue:	English
Publié:	2014
Accès à la collection:	Journal of applied crystallography
Sujets:	Journal Article computer programs data processing single-crystal X-ray diffraction