A short-pulse X-ray beamline for spectroscopy and scattering

Experimental facilities for picosecond X-ray spectroscopy and scattering based on RF deflection of stored electron beams face a series of optical design challenges. Beamlines designed around such a source enable time-resolved diffraction, spectroscopy and imaging studies in chemical, condensed matte...

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Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 21(2014), Pt 5 vom: 22. Sept., Seite 1194-9
Auteur principal: Reininger, R (Auteur)
Autres auteurs: Dufresne, E M, Borland, M, Beno, M A, Young, L, Evans, P G
Format: Article en ligne
Langue:English
Publié: 2014
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article Research Support, U.S. Gov't, Non-P.H.S. X-ray beamline picosecond X-ray pulses time-resolved spectroscopy and scattering