On the characterization of ultra-precise X-ray optical components : advances and challenges in ex situ metrology

To fully exploit the ultimate source properties of the next-generation light sources, such as free-electron lasers (FELs) and diffraction-limited storage rings (DLSRs), the quality requirements for gratings and reflective synchrotron optics, especially mirrors, have significantly increased. These co...

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Veröffentlicht in:	Journal of synchrotron radiation. - 1994. - 21(2014), Pt 5 vom: 29. Sept., Seite 968-75
1. Verfasser:	Siewert, F (VerfasserIn)
Weitere Verfasser:	Buchheim, J, Zeschke, T, Störmer, M, Falkenberg, G, Sankari, R
Format:	Online-Aufsatz
Sprache:	English
Veröffentlicht:	2014
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article Research Support, Non-U.S. Gov't NOM X-ray optics focusing mirrors metrology for synchrotron optics multilayer slope measurement synchrotron optics