Novel Method of Measuring Cantilever Deflection during an AFM Force Measurement
A combination of a reflection interference contrast microscope (RICM) and the atomic force microscope (AFM) was used to monitor the cantilever-surface separation distance during force measurements using the streptavidin-biotin recognition pairs. The RICM showed that the cantilever loses contact with...
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 12(1996), 22 vom: 30. Okt., Seite 5244-5246 |
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| Auteur principal: | |
| Autres auteurs: | , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
1996
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
| Sujets: | Journal Article |