Local diffusion induced roughening in cobalt phthalocyanine thin film growth

We have studied the kinetic roughening in the growth of cobalt phthalocyanine (CoPc) thin films grown on SiO2/Si(001) surfaces as a function of the deposition time and the growth temperature using atomic force microscopy (AFM). We have observed that the growth exhibits the formation of irregular isl...

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Publié dans:	Langmuir : the ACS journal of surfaces and colloids. - 1985. - 30(2014), 29 vom: 29. Juli, Seite 8735-40
Auteur principal:	Gedda, Murali (Auteur)
Autres auteurs:	Subbarao, Nimmakayala V V, Goswami, Dipak K
Format:	Article en ligne
Langue:	English
Publié:	2014
Accès à la collection:	Langmuir : the ACS journal of surfaces and colloids
Sujets:	Journal Article