Towards tender X-rays with Zernike phase-contrast imaging of biological samples at 50 nm resolution
X-ray microscopy is a commonly used method especially in material science application, where the large penetration depth of X-rays is necessary for three-dimensional structural studies of thick specimens with high-Z elements. In this paper it is shown that full-field X-ray microscopy at 6.2 keV can...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 21(2014), Pt 4 vom: 21. Juli, Seite 790-4
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| 1. Verfasser: |
Vartiainen, Ismo
(VerfasserIn) |
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| Weitere Verfasser: |
Warmer, Martin,
Goeries, Dennis,
Herker, Eva,
Reimer, Rudolph,
David, Christian,
Meents, Alke |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2014
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
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| Schlagworte: | Journal Article
Research Support, Non-U.S. Gov't
X-ray microscopy
Zernike phase contrast
biological samples |
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