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231224s2014 xx |||||o 00| ||eng c |
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|a 10.1002/adma.201400859
|2 doi
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|a eng
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|a Davis, Andrew R
|e verfasserin
|4 aut
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|a Spatially mapping charge carrier density and defects in organic electronics using modulation-amplified reflectance spectroscopy
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|c 2014
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|a Text
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|a ƒaComputermedien
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|a Date Completed 12.05.2015
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|a Date Revised 30.09.2020
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a © 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
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|a Charge-modulated optical spectroscopy is used to achieve dynamic two-dimensional mapping of the charge-carrier distribution in poly(3-hexylthiophene) thin-film transistors. The resulting in-channel distributions evolve from uniformly symmetric to asymmetrically saturated as the devices are increasingly biased. Furthermore, physical, chemical, and electrical defects are spatially resolved in cases where their presence is not obvious from the device performance
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|a Journal Article
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|a Research Support, Non-U.S. Gov't
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|a Research Support, U.S. Gov't, Non-P.H.S.
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|a conjugated polymers
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|a imaging
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|a modulation spectroscopy
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1 |
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|a Pye, Lorelle N
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Katz, Noam
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Hudgings, Janice A
|e verfasserin
|4 aut
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| 700 |
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|a Carter, Kenneth R
|e verfasserin
|4 aut
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|t Advanced materials (Deerfield Beach, Fla.)
|d 1998
|g 26(2014), 26 vom: 09. Juli, Seite 4539-45
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|g volume:26
|g year:2014
|g number:26
|g day:09
|g month:07
|g pages:4539-45
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|u http://dx.doi.org/10.1002/adma.201400859
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