Spatially mapping charge carrier density and defects in organic electronics using modulation-amplified reflectance spectroscopy

Spatially mapping charge carrier density and defects in organic electronics using modulation-amplified reflectance spectroscopy

© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 26(2014), 26 vom: 09. Juli, Seite 4539-45
1. Verfasser: Davis, Andrew R (VerfasserIn)
Weitere Verfasser: Pye, Lorelle N, Katz, Noam, Hudgings, Janice A, Carter, Kenneth R
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2014
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Research Support, U.S. Gov't, Non-P.H.S. conjugated polymers imaging modulation spectroscopy
Beschreibung
Zusammenfassung:© 2014 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Charge-modulated optical spectroscopy is used to achieve dynamic two-dimensional mapping of the charge-carrier distribution in poly(3-hexylthiophene) thin-film transistors. The resulting in-channel distributions evolve from uniformly symmetric to asymmetrically saturated as the devices are increasingly biased. Furthermore, physical, chemical, and electrical defects are spatially resolved in cases where their presence is not obvious from the device performance
Beschreibung:Date Completed 12.05.2015
Date Revised 30.09.2020
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201400859