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231224s2013 xx |||||o 00| ||eng c |
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|a 10.1021/la401453e
|2 doi
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|a eng
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|a Sel, Ozlem
|e verfasserin
|4 aut
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|a Determination of the diffusion coefficient of protons in Nafion thin films by ac-electrogravimetry
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|c 2013
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Completed 11.06.2014
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|a Date Revised 12.11.2013
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a This letter deals with an adaptation of the ac-electrogravimetry technique to extract separately the dynamic properties of H(+) and water in Nafion nanometric thin films (average thickness of 400 nm). An original theoretical approach was developed to extract the representative parameters from ac-electrogravimetry data. The concentration change of the exchanged species and the diffusion coefficient of the protons in a Nafion nanometric thin film (D = 0.5 × 10(-6) cm(2) s(-1) at 0.3 V vs SCE) were estimated for the first time according to the applied potential. The conductivity value of Nafion thin films was calculated from the Nernst-Einstein equation using diffusion coefficients and concentration values extracted from ac-electrogravimetry data. The calculated conductivity results agree well with the experimental proton conductivity values of Nafion thin films
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|a Journal Article
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|a To Thi Kim, L
|e verfasserin
|4 aut
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|a Debiemme-Chouvy, Catherine
|e verfasserin
|4 aut
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|a Gabrielli, Claude
|e verfasserin
|4 aut
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|a Laberty-Robert, Christel
|e verfasserin
|4 aut
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|a Perrot, Hubert
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Langmuir : the ACS journal of surfaces and colloids
|d 1999
|g 29(2013), 45 vom: 12. Nov., Seite 13655-60
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|x 1520-5827
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|g volume:29
|g year:2013
|g number:45
|g day:12
|g month:11
|g pages:13655-60
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|u http://dx.doi.org/10.1021/la401453e
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