Determination of the diffusion coefficient of protons in Nafion thin films by ac-electrogravimetry
This letter deals with an adaptation of the ac-electrogravimetry technique to extract separately the dynamic properties of H(+) and water in Nafion nanometric thin films (average thickness of 400 nm). An original theoretical approach was developed to extract the representative parameters from ac-ele...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 29(2013), 45 vom: 12. Nov., Seite 13655-60
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| 1. Verfasser: |
Sel, Ozlem
(VerfasserIn) |
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| Weitere Verfasser: |
To Thi Kim, L,
Debiemme-Chouvy, Catherine,
Gabrielli, Claude,
Laberty-Robert, Christel,
Perrot, Hubert |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2013
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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