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231224s2013 xx |||||o 00| ||eng c |
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|a 10.1107/S0909049513012053
|2 doi
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|a pubmed24n0761.xml
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|a (NLM)23765303
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|a DE-627
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|a eng
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|a Abd El All, N
|e verfasserin
|4 aut
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|a Accuracy evaluation in temperature-dependent EXAFS measurements of CdTe
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|c 2013
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
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|2 rdamedia
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|a ƒa Online-Ressource
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|a Date Completed 06.01.2014
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|a Date Revised 14.06.2013
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a The evaluation of uncertainty in temperature-dependent EXAFS measurements is discussed, considering the specific case of a recent experiment performed on CdTe. EXAFS at both Cd and Te K-edges was measured at different times and at different beamlines in a temperature range from 5 to 300 K. Attention is focused on the nearest-neighbours parameters: bond thermal expansion, parallel and perpendicular mean-square relative displacements and the third cumulant. Different causes of uncertainty, a comparison of experimental results with theoretical models, the difference between EXAFS and crystallographic thermal expansions and the meaning of the third cumulant are discussed
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|a Journal Article
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|a Debye model
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|a EXAFS
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|a Einstein model
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|a mean-square relative displacements
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|a thermal expansion
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|a Thiodjio Sendja, B
|e verfasserin
|4 aut
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|a Grisenti, R
|e verfasserin
|4 aut
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|a Rocca, F
|e verfasserin
|4 aut
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|a Diop, D
|e verfasserin
|4 aut
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|a Mathon, O
|e verfasserin
|4 aut
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|a Pascarelli, S
|e verfasserin
|4 aut
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|a Fornasini, P
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 20(2013), Pt 4 vom: 07. Juli, Seite 603-13
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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|g volume:20
|g year:2013
|g number:Pt 4
|g day:07
|g month:07
|g pages:603-13
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|u http://dx.doi.org/10.1107/S0909049513012053
|3 Volltext
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