The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source
As an increasingly important structural-characterization technique, grazing-incidence X-ray scattering (GIXS) has found wide applications for in situ and real-time studies of nanostructures and nanocomposites at surfaces and interfaces. A dedicated beamline has been designed, constructed and optimiz...
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Détails bibliographiques
Publié dans: | Journal of synchrotron radiation. - 1994. - 19(2012), Pt 4 vom: 15. Juli, Seite 627-36
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Auteur principal: |
Jiang, Zhang
(Auteur) |
Autres auteurs: |
Li, Xuefa,
Strzalka, Joseph,
Sprung, Michael,
Sun, Tao,
Sandy, Alec R,
Narayanan, Suresh,
Lee, Dong Ryeol,
Wang, Jin |
Format: | Article en ligne
|
Langue: | English |
Publié: |
2012
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Accès à la collection: | Journal of synchrotron radiation
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Sujets: | Journal Article
Research Support, U.S. Gov't, Non-P.H.S. |