The dedicated high-resolution grazing-incidence X-ray scattering beamline 8-ID-E at the Advanced Photon Source

As an increasingly important structural-characterization technique, grazing-incidence X-ray scattering (GIXS) has found wide applications for in situ and real-time studies of nanostructures and nanocomposites at surfaces and interfaces. A dedicated beamline has been designed, constructed and optimiz...

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Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 19(2012), Pt 4 vom: 15. Juli, Seite 627-36
1. Verfasser: Jiang, Zhang (VerfasserIn)
Weitere Verfasser: Li, Xuefa, Strzalka, Joseph, Sprung, Michael, Sun, Tao, Sandy, Alec R, Narayanan, Suresh, Lee, Dong Ryeol, Wang, Jin
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2012
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Research Support, U.S. Gov't, Non-P.H.S.