Energy resolution of the CdTe-XPAD detector : calibration and potential for Laue diffraction measurements on protein crystals

The XPAD3S-CdTe, a CdTe photon-counting pixel array detector, has been used to measure the energy and the intensity of the white-beam diffraction from a lysozyme crystal. A method was developed to calibrate the detector in terms of energy, allowing incident photon energy measurement to high resoluti...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 19(2012), Pt 3 vom: 29. Mai, Seite 323-31
1. Verfasser: Medjoubi, Kadda (VerfasserIn)
Weitere Verfasser: Thompson, Andrew, Bérar, Jean-François, Clemens, Jean-Claude, Delpierre, Pierre, Da Silva, Paulo, Dinkespiler, Bernard, Fourme, Roger, Gourhant, Patrick, Guimaraes, Beatriz, Hustache, Stéphanie, Idir, Mourad, Itié, Jean-Paul, Legrand, Pierre, Menneglier, Claude, Mercere, Pascal, Picca, Frederic, Samama, Jean-Pierre
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2012
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Muramidase EC 3.2.1.17
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520 |a The XPAD3S-CdTe, a CdTe photon-counting pixel array detector, has been used to measure the energy and the intensity of the white-beam diffraction from a lysozyme crystal. A method was developed to calibrate the detector in terms of energy, allowing incident photon energy measurement to high resolution (approximately 140 eV), opening up new possibilities in energy-resolved X-ray diffraction. In order to demonstrate this, Laue diffraction experiments were performed on the bending-magnet beamline METROLOGIE at Synchrotron SOLEIL. The X-ray energy spectra of diffracted spots were deduced from the indexed Laue patterns collected with an imaging-plate detector and then measured with both the XPAD3S-CdTe and the XPAD3S-Si, a silicon photon-counting pixel array detector. The predicted and measured energy of selected diffraction spots are in good agreement, demonstrating the reliability of the calibration method. These results open up the way to direct unit-cell parameter determination and the measurement of high-quality Laue data even at low resolution. Based on the success of these measurements, potential applications in X-ray diffraction opened up by this type of technology are discussed 
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700 1 |a Thompson, Andrew  |e verfasserin  |4 aut 
700 1 |a Bérar, Jean-François  |e verfasserin  |4 aut 
700 1 |a Clemens, Jean-Claude  |e verfasserin  |4 aut 
700 1 |a Delpierre, Pierre  |e verfasserin  |4 aut 
700 1 |a Da Silva, Paulo  |e verfasserin  |4 aut 
700 1 |a Dinkespiler, Bernard  |e verfasserin  |4 aut 
700 1 |a Fourme, Roger  |e verfasserin  |4 aut 
700 1 |a Gourhant, Patrick  |e verfasserin  |4 aut 
700 1 |a Guimaraes, Beatriz  |e verfasserin  |4 aut 
700 1 |a Hustache, Stéphanie  |e verfasserin  |4 aut 
700 1 |a Idir, Mourad  |e verfasserin  |4 aut 
700 1 |a Itié, Jean-Paul  |e verfasserin  |4 aut 
700 1 |a Legrand, Pierre  |e verfasserin  |4 aut 
700 1 |a Menneglier, Claude  |e verfasserin  |4 aut 
700 1 |a Mercere, Pascal  |e verfasserin  |4 aut 
700 1 |a Picca, Frederic  |e verfasserin  |4 aut 
700 1 |a Samama, Jean-Pierre  |e verfasserin  |4 aut 
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