Sensitivity analysis in bayesian classification models : multiplicative deviations
The sensitivity of Bayesian pattern recognition models to multiplicative deviations in the prior and conditional probabilities is investigated for the two-class case. Explicit formulas are obtained for the factor K by which the computed posterior probabilities should be divided in order to eliminate...
| Veröffentlicht in: | IEEE transactions on pattern analysis and machine intelligence. - 1979. - 2(1980), 3 vom: 01. März, Seite 261-6 |
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| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
1980
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on pattern analysis and machine intelligence |
| Schlagworte: | Journal Article |