Selecting critical patterns based on local geometrical and statistical information

Pattern selection methods have been traditionally developed with a dependency on a specific classifier. In contrast, this paper presents a method that selects critical patterns deemed to carry essential information applicable to train those types of classifiers which require spatial information of t...

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Veröffentlicht in:IEEE transactions on pattern analysis and machine intelligence. - 1979. - 33(2011), 6 vom: 15. Juni, Seite 1189-201
1. Verfasser: Li, Yuhua (VerfasserIn)
Weitere Verfasser: Maguire, Liam
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2011
Zugriff auf das übergeordnete Werk:IEEE transactions on pattern analysis and machine intelligence
Schlagworte:Journal Article Research Support, Non-U.S. Gov't
LEADER 01000naa a22002652 4500
001 NLM207482578
003 DE-627
005 20231224002154.0
007 cr uuu---uuuuu
008 231224s2011 xx |||||o 00| ||eng c
024 7 |a 10.1109/TPAMI.2010.188  |2 doi 
028 5 2 |a pubmed24n0692.xml 
035 |a (DE-627)NLM207482578 
035 |a (NLM)21493967 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Li, Yuhua  |e verfasserin  |4 aut 
245 1 0 |a Selecting critical patterns based on local geometrical and statistical information 
264 1 |c 2011 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 30.09.2011 
500 |a Date Revised 10.12.2019 
500 |a published: Print 
500 |a Citation Status MEDLINE 
520 |a Pattern selection methods have been traditionally developed with a dependency on a specific classifier. In contrast, this paper presents a method that selects critical patterns deemed to carry essential information applicable to train those types of classifiers which require spatial information of the training data set. Critical patterns include those edge patterns that define the boundary and those border patterns that separate classes. The proposed method selects patterns from a new perspective, primarily based on their location in input space. It determines class edge patterns with the assistance of the approximated tangent hyperplane of a class surface. It also identifies border patterns between classes using local probability. The proposed method is evaluated on benchmark problems using popular classifiers, including multilayer perceptrons, radial basis functions, support vector machines, and nearest neighbors. The proposed approach is also compared with four state-of-the-art approaches and it is shown to provide similar but more consistent accuracy from a reduced data set. Experimental results demonstrate that it selects patterns sufficient to represent class boundary and to preserve the decision surface 
650 4 |a Journal Article 
650 4 |a Research Support, Non-U.S. Gov't 
700 1 |a Maguire, Liam  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t IEEE transactions on pattern analysis and machine intelligence  |d 1979  |g 33(2011), 6 vom: 15. Juni, Seite 1189-201  |w (DE-627)NLM098212257  |x 1939-3539  |7 nnns 
773 1 8 |g volume:33  |g year:2011  |g number:6  |g day:15  |g month:06  |g pages:1189-201 
856 4 0 |u http://dx.doi.org/10.1109/TPAMI.2010.188  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 33  |j 2011  |e 6  |b 15  |c 06  |h 1189-201